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Vol 4 No 2 July 1960 Vol 4 No
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alloy anisotropy annealed atomic axis bits Bloch wall bulk calculated characteristic circuit code points concentration correlation crystal curves cut-set decrease density deposition determined digits diodes domain walls doping edge effect electrical electron elements energy epitaxial equation error error-correcting codes etching evaporation experimental Figure film thickness finite formula function germanium given graph growth hypothesis impurity increase interface logical machine magnetic field matrix mean free path measured method miniscope n-type Neel walls nn nn nn normal observed obtained p-n junction permalloy Phys Physical Review position predicate calculus priori credibilities problem procedure proof pulse quantifiers R. L. Garwin ratio region Research resistance sample seed sentence sequent shown in Fig silicon specular reflection substrate superconducting surface switching temperature terminal capacity matrix theorem theory thin films tion transition tube Type vacuum vapor-grown variables variation vector voltage zero