Digest of PapersIEEE, 1979 - Integrated circuits |
Contents
SESSION 6SELFTEST AT BOARD AND SYSTEM | 95 |
A Stolte N C Berglund | 127 |
R Kowalchuk | 155 |
Copyright | |
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Common terms and phrases
additional algorithm allow analog analysis applied approach automatic becomes block bubble CALL cause chip circuit clock codec comparator complex component Conference cost cycle delay described detection determine developed device drive effective elements equipment error example failed failure fault field Figure functional gate hardware IEEE increase initial input instruction internal isolation limits logic loops measure memory method microprocessor module node observed occur operation output parameters path performance pins port possible present problem processor production pulse reduced selected sequence Session shift shown shows signal signature simulation single specification speed STATUS step Table techniques temperature test pattern test program test system testability tester tion unit values VLSI voltage