ProceedingsIEEE Computer Society Press, 1984 - Computer storage devices |
Contents
Wm J Warwick Vice President Robert Albrow Chairman | 1 |
1 | 7 |
INTERNATIONAL | 8 |
Copyright | |
34 other sections not shown
Other editions - View all
Common terms and phrases
1984 International Test algorithm applied array asynchronous automatic Automation block burn-in calibration cell channel chip circuit circuitry clock CMOS combinational complex components cost cycle D/A converter debugging detected device device under test diagnostic drive electronics error example execution failure fault coverage fault model fault simulation flip-flops frequency functional test gate hardware IEEE implemented in-circuit test input integrated circuits interface International Test Conference LFSR logic logic simulator machine measurement memory method microprocessor mode module multiplex nodes operation output Paper parameters path performance probe problem processor random sample scan self-test sequential signal signature soft errors strategy stuck-at faults Table techniques temperature Teradyne test engineer test patterns test program test sequence test set test system test vectors testability analysis tester tion transistor Verifier VLSI voltage wafer waveform