ProceedingsIEEE Computer Society Press, 1989 - Computer storage devices |
Contents
Plenary Keynote Address and Invited Table | 1 |
Invited Speaker | 7 |
Concepts in Memory Testing Table | 20 |
Copyright | |
51 other sections not shown
Other editions - View all
Common terms and phrases
1989 International Test algorithm aliasing analog analysis applied architecture array assignment Automatic Test Pattern behavior block Boundary Scan cell chip clock components Computer delay faults delay test device error example fanout fault coverage fault detection fault effect fault simulation feedback filter finite state machine flip-flops frequency function gate graph hardware hypercube IEEE implementation input instruction register interconnect interface International Test Conference ISDN ITPG jitter JTAG latch length logic value loop machine macros measure memory method mode module nets node Paper parameters performed pins primary output probe probe card problem Proc procedure processor propagation sample scan path self-test sequential circuits serial SFSSE shown in Figure signal stuck-at fault STVs subnetwork subtest syndromes Table TAP controller techniques test pattern test sequence test vectors testability VLSI voltage waveform weight