Introduction to Scanning Tunneling Microscopy
Oxford University Press, May 20, 1993 - 472 pages
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
What people are saying - Write a review
We haven't found any reviews in the usual places.
Other editions - View all
apex atom apparent barrier height approximation atomic force atomic resolution Au(lll Bardeen beam bias Binnig Bloch Bloch functions Bloch wave cantilever Chapter charge density coefficients constant contour corrugation amplitude current amplifier curve dangling bonds deflection deformation diffraction effect electronic structure energy level example experimental factor feedback Feenstra Fermi level Fermi-level LDOS field-emission first-principles calculations Fourier graphite Green's function hydrogen hydrogen molecular ion input jellium jellium model lattice measured mechanical metal surface method microscopy molecules observed obtained op-amp permission perturbation piezo piezoelectric piezoelectric effect plane groups plate Reproduced from Chen s-wave s-wave-tip sample surface sample wavefunction scanning Scanning Tunneling Microscopy Schrodinger equation shown in Fig solution spherical spherical harmonics STM and AFM STM experiments STM images symmetry temperature Tersoff theory tip wavefunction tip-sample distance topographic image tube scanner tunneling conductance tunneling current tunneling matrix element tunneling spectra tunneling spectroscopy typical vacuum vibration isolation voltage wavefunctions
Page 383 - TR Albrecht, S. Akamine, TE Carver, and CF Quate, "Microfabrication of cantilever styli for the atomic force microscope,
Page vi - The Frontiers of Knowledge (to coin a phrase) are always on the move. Today's discovery will tomorrow be part of the mental furniture of every research worker. By the end of next week it will be in every course of graduate lectures. Within the month there will be a clamour to have it in the undergraduate curriculum. Next year, I do believe, it will seem so commonplace that it may be assumed to be known by every schoolboy.
Page 397 - The Art and Science and Other Aspects of Making Sharp Tips,
Page 398 - Noise Reduction Techniques in Electronic Systems. John Wiley and Sons, NY Ott, BW, 1981, "Digital Circuit Grounding and Interconnections".