Selected Papers on Electron Optics |
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Page 214
... energy spread for the emitted electrons ( typically 0.9 eV ) which can limit the minimum probe diameter , especially at low accelerating voltages , and which does limit the energy resolution for specimen characteristic energy - loss ...
... energy spread for the emitted electrons ( typically 0.9 eV ) which can limit the minimum probe diameter , especially at low accelerating voltages , and which does limit the energy resolution for specimen characteristic energy - loss ...
Page 218
... ENERGY LOSS ( eV ) ENERGY LOSS ( eV ) ( d ) ( 4 ) 30 20 ( 9 ) FIG . 6. Micrographs of a thin evaporated aluminum specimen . Figure 6a ) is a micrograph taken with zero - energy - loss electrons , while ( b ) , ( c ) , ( d ) , and ( e ) ...
... ENERGY LOSS ( eV ) ENERGY LOSS ( eV ) ( d ) ( 4 ) 30 20 ( 9 ) FIG . 6. Micrographs of a thin evaporated aluminum specimen . Figure 6a ) is a micrograph taken with zero - energy - loss electrons , while ( b ) , ( c ) , ( d ) , and ( e ) ...
Page 238
... energy of the entire system . Owing to conservation of energy , the relation between the wave vectors k , and k , and the energy loss ħwn m of the scattered electron is - k2 = k2 = k ? – 2m¿wnm / ħ , ( 2 ) where me is the mass of the ...
... energy of the entire system . Owing to conservation of energy , the relation between the wave vectors k , and k , and the energy loss ħwn m of the scattered electron is - k2 = k2 = k ? – 2m¿wnm / ħ , ( 2 ) where me is the mass of the ...
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Abbildung aberration coefficients amplitude angle aperture approximation astigmatism atoms axial Bild Boersch calculated cathode characteristic function chromatic aberration coil constant contrast correction corresponding curve deflection density diameter diffraction distance distribution electron beam electron gun electron microscope electron optics electrostatic Elektronen emission energy equation Feld figure filament first-order focal length focusing Fourier transform fringes function Gaussian given Glaser Hanszen hologram illumination image plane integral lentille limit Linse Linsen magnetic field magnetic lens magnetische magnification method micrograph object plane objective lens obtained optic axis Optik parameter paraxial particles perturbation Phys Physics pole pieces position potential reconstruction resolution resolving power rotation scanning electron scanning electron microscope scanning microscope scattering Scherzer screen specimen spherical aberration Spule structure superconducting surface symmetry third-order tion trajectory tube voltage wave zero