Optical Design and Testing, Parts 1-2SPIE, 2004 - Optical instruments |
Contents
Distancelearning postgraduate education in optics and optical design Invited Paper | 8 |
The kurtosis parametric characteristics of light beams passing through aberrated fractional | 19 |
Intensity distribution topography on pupils image in EPR 563805 | 27 |
Copyright | |
29 other sections not shown
Other editions - View all
Common terms and phrases
accuracy algorithm analysis analyzer angle aperture aspheric aspheric surface axis beam splitter calculated calibration camera coordinate curve deformation Design and Testing detector diameter diffraction display edited by Yongtian equation eye pupil eye socket fabrication FDTD Figure focal Fractional Fourier transforms frequency FRFT systems fringe gauge block Gaussian beam gazing direction Hartmann sensor HD-DVD heterodyne illumination Institute of Optics instrument intensity interferogram interferometer kurtosis kurtosis parameter laser lens light distribution light source linear measurement merit function method mirror modulation obtained Optical Design optical system optimization output pattern phase phase-shifting pixels plane polarization polishing prism Proc pupil image reflected reflector refractive index retardance rotating rotating-mirror Sasián scanning segment shape Shenghua Ye shown in Fig simulation spatial speckle image spherical aberration SPIE Vol technique Technology China Univ wave plate wavefront wavelength Yongtian Wang Zhicheng Weng