International Test Conference, 1992: ProceedingsInstitute of Electrical and Electronics Engineers Annotation The proceedings of the 23rd edition of the premier technical conference on electronic testing, held in Baltimore, Maryland, September 1992, comprise papers, panels, and tutorials in the areas of design and test integration; test management; software; test hardware; device, assembly, and system test; and IEEE test standards. ITC's 1992 theme, Discover the New World of Test and Design, reflects the growing emphasis on tighter integration of test and design to assure the highest quality products. No subject index. Ruggedly bound for heavy use. Annotation copyrighted by Book News, Inc., Portland, OR. |
Common terms and phrases
algorithm applied ATPG backplane BiCMOS block boundary scan bridging faults cell checker chip circuitry clock cycles CMOS components Computer cost delay fault delay test detected device diagnostic driver EDIF error example fault coverage fault injection fault model fault simulation fault-free flip-flops function gate hardware IDDQ test IEEE implementation initial interconnects International Test Conference k-UCP latch logic logic value macro memory method mode module node operation Paper performed primary inputs primary outputs problem Proc propagation protocol PSBM random reduced scan chain scan design scan path selected self-test sequential circuit shown in Figure signal signature stuck-at faults Table technique Test Conf TEST CONFERENCE 1992 test pattern test program test registers test sequence test session test set test vectors testability tester tion transistor transition fault Type Type I errors verify VLSI voltage waveform