Proceedings, ... Annual Meeting, Electron Microscopy Society of America, Volume 47San Francisco Press, 1989 - Electron microscopes |
Contents
Direct imaging of nucleic acid conformation in water by scanning tunneling microscopy | 36 |
Accuracy and precision in data analysisP Trebbia | 42 |
Multislice calculation of Kikuchi patternsG Y | 52 |
Copyright | |
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AlGaAs alloy aluminum amorphous analysis angle annealed aperture Arizona State University atoms calculated carbon catalyst CBED cell Center ceramic composition confocal contrast Copyright defects deformation density detector diameter diffraction pattern dislocations edge EELS electron beam electron diffraction EMSA energy loss epitaxial experimental fibers field emission Figure GaAs grain boundaries high resolution indicated interface Laboratory lattice layer lens Lett Materials Science matrix metal microanalysis micrograph microscope microstructure molecular morphology observed obtained optical orientation oxide oxygen particles peak phase Phys plane polymer precipitates probe Proc reflections region Research sample San Francisco Press scanning scanning electron microscopy SCANNING TUNNELING MICROSCOPY secondary electron selected area diffraction shown in Fig shows silicon single crystal specimen spectra spectrin spherulite structure substrate superconducting supported surface symmetry techniques thickness thin films tilt transmission electron microscopy twin Ultramicroscopy voltage x-ray