Microwave Integrated Circuits

Front Cover
I. Kneppo
Springer Science & Business Media, Dec 31, 1993 - Technology & Engineering - 329 pages
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Microwave Integrated Circuits provides a comprehensive overview of analysis and design methods for integrated circuits and devices in microwave systems. Passive and active devices, and linear and non-linear circuits are covered with a final chapter detailing measurement and test techniques.
 

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Contents

Introduction
1
Analysis of passive circuit elements
5
212 Microstrip lines
16
213 Suspended and inverted microstrip line
27
214 Coplanar line
32
215 Slot line
41
216 Finline
44
217 Coupled lines
54
413 Synthesis of nport on the base of elementary twoports
186
414 Nonlinear MICs
189
42 BASIC LINEAR CIRCUITS
199
422 Resonators
202
423 Matching transformers
203
424 Lowpass filter
205
425 RF chokes
212
426 Bandpass niters
216

218 Methods of homogeneous line analysis
65
22 DISCONTINUITIES
80
222 Methods of the discontinuity analysis
81
223 Microstrip discontinuities
94
224 Discontinuities in other transmission lines for MIC
111
23 LUMPED ELEMENTS
118
233 Inductive elements
122
234 Resistive elements
125
REFERENCES 21
130
Modelling of active semiconductor circuit elements
136
32 VARACTOR DIODES
143
33 pin DIODES
148
34 BIPOLAR TRANSISTORS
153
35 MESFETs
157
36 HEMTs
169
REFERENCES
172
Basic circuits
173
411 The matrix representation
175
412 Network matrix decomposition
180
427 Attenuators
221
428 Power dividers
225
429 Directional coupling element and hybrid elements
230
4210 Differential phase shifter
234
4211 Baluns and magictee
236
43 BASIC ACTIVE NONLINEAR CIRCUITS
239
432 Mixers
244
433 Oscillators
258
434 Amplifiers
268
4341 Lownoise amplifiers
269
4342 Power amplifiers
284
REFERENCES 41
286
I Kneppo and J Fabian
291
MICROWAVE TEST FIXTURES AND PROBES
293
52 MEASUREMENT TECHNIQUES
300
522 Noise measurement
317
REFERENCES
322
Index
327
Copyright

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Page 323 - IRE, Standards on methods of measuring noise in linear twoports, 1959, Proc.
Page 325 - MJW Rodwell, M. Riaziat, KJ Weingarten, BA Auld, and DM Bloom, "Internal microwave propagation and distortion characteristics of traveling-wave amplifiers studied by electrooptic sampling", IEEE Trans.
Page 325 - An Improved Computational Method for Noise Parameter Measurement,
Page 326 - Picosecond Optical Sampling of GaAs Integrated Circuits,

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