Microscopy of Semiconducting Materials 1997: Proceedings of the Royal Microscopical Society Conference held at Oxford University, 7-10 April 1997
A.G Cullis, J.L Hutchinson
Taylor & Francis, Jan 1, 1997 - Technology & Engineering - 326 pages
This tenth volume in the series provides an overview of recent developments and current research activity including both invited review and summary research papers. Particular importance is attached at this meeting to papers addressing the centenary of the discovery of the electron. "MSM" has become the premier forum for dissemination of research results in this well established field, which is of continuing importance for the analysis of both reliable substrate materials, and as-grown devices in the whole range of semiconducting materials. It covers developments in analysis techniques across the whole range of microscopies. Also includes specimen preparation techniques.
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