The Electron Microscope: Its Development, Present Performance and Future Possibilities |
Contents
THE ORIGIN OF CONTRAST IN ELECTRON MICRO | 40 |
THE RESOLUTION LIMIT OF THE UNCORRECTED | 56 |
THE DETECTION LIMIT OF THE UNCORRECTED | 62 |
Copyright | |
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Abbé Airy disk aperture appears Applied Phys Ardenne assumed axial axis Bacteriophage Broglie wavelength cathode ray tube cent chapter chromatic aberration chromatic error collisions condenser lens contrast deflected density diameter diffraction error disk distribution divergence driving voltage effect elastically scattered elec electron lenses electron micro electron micrographs electron optics electrostatic lens electrostatic lenses electrostatic microscope energy losses equation factor fluctuation fluorescent screen focal length focused Fresnel diffraction Fresnel fringes geometrical Hillier illuminating beam inelastic instrument intensity light optics Louis de Broglie magnetic field magnetic lens magnetic microscope magnification Marton means objective aperture obtained optical microscope particles photographic plate physical aperture pole pieces potential produce R.C.A. microscope radial radius reduce refractive index resolution limit resolving power Ruska scanning scattered electrons shows space charge specimen spherical aberration steradian sufficient supermicroscope thin tion tron tube uncorrected V. K. Zworykin velocity volts X-rays