Advances in Laser Scanning Technology: August 27-28, 1981, San Diego, CaliforniaLeo Beiser |
Common terms and phrases
accuracy achieved acousto-optic alignment anamorphic angle angular applications arc sec arc seconds assembly autocollimator axis bandwidth beam waist CALIFORN CALIFORNIA capacitance circuit collimated components crystal deflector device diamond machining Dichromated Gelatin diffraction efficiency diode lasers disk EDAC electrode ERSITY fabrication facet field film filter fixture frequency fringe function galvanometer Gaussian beam geometric grating Holofacet hologram holographic holographic scanner input interferometer laser beam laser diode Laser Scanning lens light linear material measured mirror mirrorlet modulator noise operation optical disc optical elements optical scanners optical system output parallel parameters performance phase photoconductor photodiode photoresist pixel plane polygon position pulse pyramidal errors ray tracing readout recording reference reflected replication resolution rotating rotor SAN DIEGO scan line scan pattern scanning system sensitivity shown in Figure signal spatial spatial light modulator spinner spot substrate surface techniques typical UNIV UNIVERSITY variation voltage wavelength zoom