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amplitude contrast angstroms annealed Annealed nickel area diffraction pattern bake boundary energy bright field Burgers vectors c-axis C0 exposure carbon monoxide contamination continuous film continuous graphite films creases crystal D. W. Pashley dark field images dark field microscopy defocus diameter DP boundary e-Gun Edge dislocations electron beam electron microscope epitaxial nickel films evaporation exposed Figure films grown flange formvar films glissile dislocations graphite growth graphite lattice graphite overlay graphite substrates graphite surface Grenga holes holey formvar hundred angstroms indicated l0 torr range lattice fringes lattice image mica micrographs micron Moire fringes Moire patterns mounted nickel carbonyl nickel deposit nickel surface normal observed ohms orientation overlapping crystallites partial dislocations platelets pressure pyrolytic graphite reciprocal lattice region of graphite removed restructured nickel result SAD patterns scattered electrons Selected area diffraction shadowing material sorption pump structure techniques temperature thick crystallites thin graphite thousand angstroms Topography torr sec troughs typically valve