Silicon Nitride and Silicon Dioxide Thin Insulating Films: Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
M. Jamal Deen
The Electrochemical Society, 1997 - Electric insulators and insulation - 588 pages
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Page 98 - EH Nicollian and JR Brews, MOS (Metal Oxide Semiconductor) Physics and Technology, John Wiley & Sons, New York, 1982, p.
Page 330 - International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. J. Ruzyllo and RE Novak eds., Vol.
Page 251 - The authors would like to thank the Natural Science and Engineering Research Council of Canada (NSERC), and the Concordia-Seagram Fund for supporting this research.
Page 164 - Department of Electrical and Computer Engineering Concordia University 1455 de Maisonneuve Blvd. West Montreal, Quebec, Canada H3G IMS Abstract In this paper, a two-layer hierarchical video coding technique that is compatible with MPEG2 is presented.
Page 33 - R. Degraeve, JL Ogier, R. Bellens, Ph. Roussel, G. Groeseneken, and HE Maes, "On the Field Dependence of Intrinsic and Extrinsic Time- Dependent Dielectric Breakdown,"/>roc.
Page 44 - Hole Injection SiO2 Breakdown Model for Very Low Voltage Lifetime Extrapolation", IEEE Trans.
Page 316 - Center for Solid State Electronics Research, Arizona State University, Tempe, AZ 85287-6206...
Page 232 - Department of Materials Science and Engineering, Stanford University...