Scanning Electron Microscopy Systems and Applications 1973,

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Institute of Physics (Great Britain). Electron Microscopy and Analysis Group
Taylor & Francis, Nov 1, 1973 - Art - 338 pages

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Contents

The carbon field emitter as an electron gun source
12
A comparison between LaB6 and W electron emitters in a
28
An ultrahigh vacuum scanning electron microscope with Auger analysis facilities
42
Copyright

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