Noise in Solid State Devices and CircuitsGives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise. |
Common terms and phrases
1/f noise amplifier stage AN² average calculate capacitance carriers channel conductance constant correlated density device device under test drain effect energy Englewood Cliffs equation equivalent circuit equivalent noise equivalent noise temperature F₁ flicker noise fluctuating full shot noise function g-r noise g(Vo g₁ GaAs gmax Hence hole IEEE Trans injection input circuit JFET low-frequency maser mixer mobility-fluctuation MOSFET N₁ N₂ noise current noise figure noise measure noise power noise resistance noise source noise temperature Nyquist's theorem oscillator output noise p-region parameter Phys Prentice-Hall quantum 1/f noise R₁ random recombination resistor S₁(f saturated diode current semiconductor short-circuited shot noise signal silicon SN(f Solid State Electron space-charge region spectrum T₁ theorem theory thermal noise transistor trap tuned tunnel diode V₁ versus voltage yields Ysat zero Ziel απ