Electron Microscopy 1974: PhysicalJ. V. Sanders, D. J. Goodchild |
Common terms and phrases
alloys analysis angle annealing aperture atoms axis Boersch bright field Burgers vectors calculated carbon chromatic aberration coefficients coherence coil CTEM curve dark field images defects defocus deformation density detector diameter diffraction pattern dislocation dislocation loops domain effect elastic electron beam electron diffraction electron micrographs electron optical energy loss experimental exsolution field emission Figure film filter foil Fourier fringes function goniometer grain boundary intensity interstitial irradiation Japan lamellae lattice image layer lenses magnetic magnification martensite material matrix metals method molybdenum nucleation objective lens observed obtained Optik orientation parameters particles Phys plane plasmon precipitates Proc region sample scanning electron microscope secondary electron selected area diffraction shown in Fig shows single crystal specimen spherical aberration spots stacking fault STEM strain structure surface technique temperature thickness thin tilt tion transmission electron microscopy twin vacancy vacuum voltage X-ray