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CCD APPLICATIONS AND CHARACTERIZATION
FOCALPLANE IMAGE PROCESSING
3 other sections not shown
1/f noise analog applications array average backside Blouke bump bonding buried channel buried-channel camera capacitance CCD image sensor charge packet charge transfer efficiency charge-coupled device chip clock confocal confocal microscopy dark current detector display drain dynamic range effect electrons fabricated film floating diffusion floating gate focal plane Ford Ford Aerospace frequency IEEE illumination image sensor increases input integration Janesick linear measured microns MOSFET node capacitance noise floor operation optical output amplifier output circuit output node performance photodiode photon photosite polysilicon Proc Quadrant-CCD quantum efficiency read noise readout noise reduced reset resolution sampling scan sensitivity serial register shift register shot noise shown in Figure shows signal charge signal level silicon Skipper CCD source follower SPIE structure substrate surface tantalum TDI imager TDI stages Tektronix temperature transfer gate transistor trap voltage wafer X-ray