Photoacoustic and Photothermal Phenomena III: Proceedings of the 7th International Topical Meeting, Doorwerth, The Netherlands, August 26-30, 1991
Photoacoustic and Photothermal Phenomena III comprises contributions explaining new topics, relevant theories, novel methods, and the developmentof instrumentation in this active research area - information that is otherwise not available in a single volume. Particular emphasis is placed on the variety of applications of photoacoustic and photothermal techniques in disciplines ranging from environmental, agricultural, medical, and biological sciences to spectroscopy, nondestructive evaluation, materials characterization, heat and mass transfer, kinetics (including ultrafast phenomena), and solid-state and surface physics. This volume provides an excellent overview of the spectrum of activities in the photoacoustic and photothermal field worldwide, and thus is suitable both for the specialist and for the newcomer to this multidisciplinary research area.
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Photoacoustic Spectra of Chlorinated Ethylenes
Photoacoustic Measurement of Vertical Ammonia Gradients
Photoacoustic In Situ Monitoring of Trace Gases in a Rural Environment
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69 Photoacoustic absorbed absorption coefficient Abstract acoustic amplitude Appl application beam deflection calculated carrier component concentration crystal curves density dependence depth detection detector determined diffusion length effect electron energy equation excitation experimental Fig.l Figure Fourier function heat diffusion increase infrared intensity interferometric laser beam laser pulse layer lock-in lock-in amplifier materials measured method mirage modulation frequency obtained optical absorption Optical Sciences parameters peak phase transition Photoacoustic and Photothermal photoacoustic signal photoacoustic spectroscopy photodiode Photothermal Phenomena Phys plasma polymer pressure probe beam properties pump beam pyroelectric radiation radiometry ratio reflected refractive index region resonance sample surface scan Scries in Optical semiconductor sensitivity setup shown in Fig shows silicon solid spectra spectrum Springer Scries substrate surface acoustic waves technique temperature theoretical thermal conductivity thermal diffusion length thermal diffusivity thermal lens thermal wave thickness thin films values variation velocity wavelength