Measurement of Wiener Spectra of Granularity Patterns in Electron Micrographs |
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II | 6 |
vanced Electronics Center He wishes to thank the General Electric Company | 7 |
Die Experimental Procedure | 16 |
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100 MICRONS 93 micron amplitude autocorrelation function chart paper computed power spectrum convolution curve cycle per Angstrom cycle per micron CYCLES/MICRON data samples diffraction pattern digital voltmeter electron micrograph electron microscope equation error Figure 14d Figure 15b Figure 18a fluctuations Fourier series Fourier transform Fraunhofer diffraction granularity pattern harmonic infinitely long integral k₁ k₂ length micro-microammeter microphotometer trace noise NORMALIZED POWER SPECTRAL obtained one-dimensional particles peaks photocell photographic emulsion grain photographic grain photographic granularity photographic plate phototube power spec POWER SPECTRAL DENSITY power spectrum computations quency random numbers result Ronchi ruling sample values SAMPLES SCANNING SLIT sampling frequency sampling interval scanning aperture scanning slit shadow-cast shown in Figure slow trends smooth SPACE FREQUENCY SPACE FREQUENCY Figure specimen spectra SPECTRAL DENSITY P(Q spectrum in Figure Spectrum of Photographic square tion transmission function transparency function trum two-dimensional power spectrum voltage width zero