## Measurement of Wiener spectra of granularity patterns in electron micrographs |

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### Contents

DJ EXPECTED ERROR IN MEASUREMENTS | 31 |

MEASUREMENTS | 39 |

FRAUNHOFER DIFFRACTION AS A DIRECT MEANS | 75 |

1 other sections not shown

### Common terms and phrases

93 micron amount of data amplitude autocorrelation function chart paper computed power spectrum convolution convolution theorem corresponding cosine transformation curve cycle per Angstrom cycle per micron dark current data samples density diffraction method digital voltmeter electron micrograph plates electron microscope equation error Evaporated Platinum Figure 14d Figure 15b Figure 18a fluctuations Fourier series Fourier transform Fraunhofer diffraction gaussian function grain spectrum granularity pattern Grating RR harmonic High Contrast high frequency infinitely long integral length magnification metal micro-microammeter Micrograph of Evaporated microphotometer trace noise particles peaks photocell photographic emulsion grain photographic grain photographic granularity photographic plate phototube Positioned Circular Discs power spectrum computations quency Randomly Positioned Circular result Ronchi ruling sample values sampling frequency scanning aperture scanning slit shadow-cast shadowing shown in Figure signal slow trends space frequency specimen spectra spectrum in Figure Spectrum of Photographic square transmission function transparency function two-dimensional power spectrum voltage width zero