Near-field Optics: Physics, Devices, and Information Processing : 22-23 July, 1999, Denver, ColoradoMotoichi Ohtsu, Suganda Jutamulia, Toshimitsu Asakura |
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Contents
an integrated microprobe for nearfield optical microscopy Invited Paper | 21 |
Nearfield scanning optical microscope using a metallized cantilever tip | 40 |
Visualization of microstructure in soft polymer films with a combined nearfieldconfocal | 49 |
Copyright | |
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aperture Appl application approach atom band beam calculation cantilever collection consists constant corresponding density dependence deposited detected developed Devices diameter dielectric direction disk distance distribution dots effect electric energy enhancement equations evanescent excitation experiment experimental fabricated fiber probe field Figure films fluorescence focused force frequency function glass illumination incident intensity interaction laser layer Lett light lines localized magnetic magneto-optical materials measured metal method microdisk microscope mode near-field optical near-field optical microscopy NSOM numerical objective observed obtained Ohtsu operation optical near-field particle performed photonic photonic crystals Phys Physics plane polarization position potential propagation protrusion quantum recording reflection region resolution resonant respectively sample scanning scattering shown shows signal simulation single SNOM space spatial spectroscopy sphere SPIE structure substrate surface technique Technology temperature theoretical theory transmission wave wavelength