Applied Charged Particle OpticsAuthored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. The book begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. The book’s wide frame of reference makes this an ideal work for researchers, engineers and graduate students alike. |
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aberration acceleration action acts angle aperture applied axial axial focusing beam becomes calculated charged particles chosen coefficients combination comp condition cross curvature curved cylindrical condenser deflection diameter direction distance diverging einzel lens electrode electrostatic emission lens emitting energy dispersion entrance entrance and exit equal equation example exit faces field boundary field strength Figure focal length focusing followed geometry given Herzog immersion ions larger lenses Liebl magnetic sector field mass means mode negative Non-uniform magnetic object obtained opposite optic axis parallel parameters particle energy Phys placed plates position possible potential potential distribution primary principal plane properties radial radius ratio refractive resolution result secondary sector angle shown shows shunts slit solutions space spherical condenser starting stigmatic imaging surface trajectories transfer matrix virtual voltage width yields zero