Conference Record /: Workshop on Industrial Applications of Machine Vision |
Contents
Optical Inspection and Machine Vision | 3 |
Experiments of Computer Vision Techniques for Industrial Applications | 21 |
Automated Chip Die Inspection | 43 |
Copyright | |
11 other sections not shown
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Common terms and phrases
algorithm allows analysis applications approach array assembly automatic automation binary boundary camera cell circuit classification complete components considered coordinates corresponding cost described detection determined developed direction distance edge equation error example extraction face Figure function given graphics hardware human illumination industrial inspection inspection system intensity light linear machine matching matrix measurement memory method moving needed object obtained operation optical orientation pattern performed picture pixels plane points position present problem Proc processing processor production projection range recognition reference reflectance region representation Research resolution robot scan scene segment sensing sensor shape shown in Figure shows signal simple single space step surface Table tasks technique threshold tion transformation vision vision system visual visual inspection wires