## Theoretical and Practical Limits of Measurement Accuracy: 2nd Symposium of the IMEKO Technical Committee on Metrology--TC8 : Proceedings |

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Page 236

OPTIMIZATION OF COSTS NECESSARY FOR DEVELOPMENT OF

E.D.Koltik, S.A.Kravchenko, V.I.Fomenko u.s.s.s. Rapid development of scientific

and ...

OPTIMIZATION OF COSTS NECESSARY FOR DEVELOPMENT OF

**MEASURING INSTRUMENTS**WITH AN ADVANCED LEVEL OF ACCURACYE.D.Koltik, S.A.Kravchenko, V.I.Fomenko u.s.s.s. Rapid development of scientific

and ...

Page 237

of devices at the (i + I)th step of the hierachy chart £3] Proa. the metrological point

of view the error of measurements is the most important criterion of the quality of

a

of devices at the (i + I)th step of the hierachy chart £3] Proa. the metrological point

of view the error of measurements is the most important criterion of the quality of

a

**measuring instrument**, whereas the limit of the permissible intrinsic error ...Page 238

Decreasing of the control tolerance means ensuring a margin of accuracy during

development and manufacture of

expressed as (I - fa~) • On the other hand, this margin of accuracy. is associated

with ...

Decreasing of the control tolerance means ensuring a margin of accuracy during

development and manufacture of

**measuring instruments**, which can beexpressed as (I - fa~) • On the other hand, this margin of accuracy. is associated

with ...

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accuracy algorithm amplifier amplitude analysis ASMW BIPM bolometer buffer solution calculated calibration calorimeter carrier characteristics coaxial transmission lines coefficient Comecon comparison constant density detection limit detector determined edge effect electrical electronic equation error function estimation experimental factor fluctuations frequency given Hungary influence quantities intercomparison interferometer interval ionization laboratory laser linear liquid luminous fluxes maximum means measurand measure-sets measurement conditions measurement results measurement uncertainty measuring devices measuring instruments ment meter method metrological noise normal obtained operation output parameters power standard precision pressure primary standard problem pseudonoise quantization quantum random range ratio realized reference reliability resonant system samples sensitivity signal stability standard deviation statistical systematic error Table temperature theoretical thermal thermodynamic temperature tion transfer standards uncertainty components unit USSR vacuum gauge variance vibration viscometer viscosity voltage