Electron Microscopy, 1980: PhysicsSeventh European Congress on Electron Microscopy Foundation, 1980 - Electron microscopy |
Contents
BIOLOGY | 2 |
Internal mechanism of a surfaceacousticwave device visualized with a modified scanning | 16 |
Application of the electron mirror interference microscope for measuring the height | 30 |
Copyright | |
4 other sections not shown
Common terms and phrases
aberration alloy amorphous analysis angle annealing aperture applied atoms axial axis biprism Bloch waves bright field Burgers vector calculated cell contrast corresponding dark field defects defocus deformation density detector diameter direction dislocations distribution domain walls electron beam electron diffraction electron microscopy emission energy experimental Figure film filter focal fringes function grain boundary high resolution holography intensity interface investigation lattice imaging layer lenses magnetic field magnification martensite material matrix measured metal method Micr micrograph microstructure mode monoclinic neutrons nucleation objective lens observed obtained optical Optik orientation oxide particles phase Phys pigeonite plane plate potential precipitates Proc region sample scanning screw dislocations shown in Fig shows signal single crystal specimen spherical aberration spots stacking fault structure surface symmetry technique temperature thickness tilting tion transformation transmission electron microscopy twin values voltage wave width Wien filter X-ray zone