International Conference on Automatic Inspection and Measurement: August 20-21, 1985, San Diego, CaliforniaRichard A. Brook, Michael J. W. Chen |
Contents
000 | 16 |
INTEGRATED SYSTEM DESIGN | 43 |
INFORMATION PROCESSING | 89 |
Copyright | |
1 other sections not shown
Common terms and phrases
acceptable algorithm allows analysis angle applications architecture array assembly automated automatic binary calculated camera cell chain code circle compared complete component contain cost defect defined described determine developed direction disk display edge elements example Figure filter frame function hardware head illumination image processing implemented industrial inspection system interface lead length light limited machine manufacturing means measurement memory method mirror module mounted needed object operations optical output parallel parameters pattern pellets performed pixels points position possible present problem processing processor production reference reflected resolution robot sample scan scattering segments selected sensor shown signal simple solar speed stage standard step stored stress structure surface Table tape tasks techniques threshold values vision visual inspection width