Stereology and Quantitative Metallography: A Symposium Presented at the Seventy-fourth Annual Meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971 |
Contents
Introduction | 1 |
Application of Topological Concepts in StereologyJ H STEELE JR | 39 |
Automatic Methods for Analysis of MicrostructuresG A MOORE | 59 |
Copyright | |
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Common terms and phrases
100-point grid 25-point grid 95 percent confidence accuracy aging temperature American Society analysis application ASTM automatic average binomial calculated coefficient of variation convex particles curvature curves determined edges electron equation error evaluation faces feature foil Fullman gamma prime geometrical gestalt parameters grain boundaries grain size grain structure Hall-Petch image measurement instruments intercept length intercept method intersections kg/mm² large number linear magnification material McCall and Boyd mean free path Metallography micrographs microscope microstructure N₁ normal distribution number of intercepts number of particles number of separate objects observed obtained operators pearlitic percent confidence level phase placement projection plane Pyromet Pyromet 860 Quantimet Quantitative Metallography random randomly raster scanner shape signal sintering space specimen standard deviation statistical steels Stereology superalloys surface Table tangent count technique television test lines threshold tion topological total number triple junctions unit V₁ variability volume fraction Waspaloy yield strength