Proceedings of DIMAT2000: The Fifth International Conference on Diffusion in Materials, Paris, France, July 17-21, 2000, Part 2 |
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Contents
Diffusion Analysis of Rhenium in Graphite Using Rutherford Backscattering | xxv |
On the Relation between Intcrdiffusion and Tracer Diffusion Coefficients | 891 |
Part 1 | 1304 |
Copyright | |
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2001 Scitec Publications a-SiCN Acta activation energy activation enthalpy alloys amorphous annealing Arrhenius atoms bicrystals bulk diffusion calculated ceramic chalcogenide glasses chemical chemical potential composition compound concentration profiles corresponding crystals decreases deformation density determined diffusion annealing diffusion coefficient diffusion couples diffusion profiles diopside dislocations effect electron enthalpy equation equilibrium experimental film flux formation GB diffusion glasses grain boundary grain boundary diffusion groove growth hydrogen implantation increase interdiffusion interface intermetallic interstitial ionic isotopes Keywords kinetics Kirkendall effect lattice layer liquid material measured mechanism metal microstructure migration nanocrystalline observed obtained oxide oxygen oxygen activity palladium parameters penetration phase phase diagram Phys point defects polycrystalline polycrystals polymer pre-exponential factor pressure reaction regime relaxation samples segregation self-diffusion silicide simulation solid solution specimens stress structure substrate surface technique thickness tracer diffusion transport triple triple junctions vacancy values volume X-ray