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Automatic visual inspection system for thin film magnetic head wafer using optical
Novel digital unsharp masking algorithm for color images 177104
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adaptive algorithm analysis applications approach binary block camera character coding coefficients color complexity compression condition considered contains contour contrast corresponding defined described detection determined developed dimension direction distribution edge effect element enhancement equation error estimation extracted field Figure filter frame function given halo IEEE image processing implemented improved intensity introduced invariants light linear matching maximum mean measure method motion noise object observed obtained operation optical original parameters pattern performance pixel plane position possible prediction present problem processing projection proposed provides quantization range recognition reconstruction reference region represented resolution respectively samples scene segmentation selected sequence shape shown shows signal space spatial step structure surface Table techniques threshold transform vector vision visual