Proceedings, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems: October 20-22, 1997, Paris, France

Front Cover

From inside the book

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

Application of a Yield Model Merging Critical Areas
11
Efficient Critical Area Estimation for Arbritary Defect Shapes
20
Realistic Fault Extraction for HighQuality Design and Test
29
Copyright

28 other sections not shown

Other editions - View all

Common terms and phrases

Bibliographic information