Scanning Electron MicroscopyVols. for 1971 includes the proceedings of the Workshop on Forensic Applications of the Scanning Electron Microscope; 1972 the proceedings of the Workshop on Biological Specimen Preparation for Scanning Electron Microscopy. |
Contents
SOME APPLICATIONS OF THE SEM AT THE PULP AND PAPER RESEARCH INSTITUTE | 13 |
APPLICATION OF THE SCANNING ELECTRON MICROSCOPE IN PALEONTOLOGY AND GEOLOGY | 29 |
EXAMINATION OF POROUS OXIDE SCALES IN THE SCANNING ELECTRON MICROSCOPE | 39 |
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alloy aluminum Ammonium Perchlorate Appl Applications IIT Research backscattered electron image beam induced Broers Buchanan Cambridge University Cathodoluminescence ceramic chemical collector contrast Cosslett crystal Davoine detector device diffusion Dissertation Elec electron beam Electron Microprobe ELECTRON MICROSCOPY/1968 Proceedings electron probe ELECTRON TRAJECTORIES Engineering Department etched Everhart examination fibers fibres field image Figure film fracture surface grain groundwood Hayes IIT Research Institute incident probe instrument integrated circuits Johari Kimoto Kyser Laboratory layer lens lignin magnification material Matta McMullan metal micrographs Micropaleontology Minkoff ning Electron Oatley observed obtained optical oscilloscope oxide p-n Junction paper particles Pease Ph.D photoresist Phys pores potential Proc Pulp replicas Research Institute Chicago sample Scanning Electron Micro Scanning Electron Microscope scanning microscope secondary electron image semiconductor shown in Fig shows silicon Smith spinel structure Sulway Symposium techniques Thornley Thornton tion Tracheids transistor transmission electron microscope tron volt voltage volts Wittry X-Ray