Investigation of Microstructural Changes in Polyetherether-ketone Films at Cryogenic Temperatures by Positron Lifetime SpectroscopyNational Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1991 - Airplanes - 9 pages |
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250 Temperature 50 100 Temperature Abe Eftekhari Aeronautics and Space Al chamber amorphous films amorphous PEEK samples amorphous samples Amorphous Semicrystalline ature Changes in Polyetherether-Ketone Clair Cryogenic Temperatures Danny dry ice errors are 1°C films to 160°C fraction versus temperature free-volume cells glass transition temperature Langley Research Center larger microvoids lifetime measurements liquid hydrogen liquid nitrogen Microvoid fraction versus microvoids decreases Na22 positron NASA nm³ Ortho-positronium lifetime PEEK at Various PEEK Films percent 50 Performing Organization Polyetherether-Ketone Films polyetherether-ketone PEEK Polymer Positron Lifetime Spectroscopy Positronium psec psec/percent psec/percent range of 23°C Research Center Hampton results are summarized room temperature sample temperature Second-component semicrystalline samples Singh Small microvoids Source/film Space Administration structure of PEEK summarized in table temper Temperature errors temperature in PEEK temperature is lowered temperature of liquid Terry Terry L test coupons third lifetime components total free volume total free-volume fraction trend in reduction Various Temperatures Virginia volume with decreasing