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CCD APPLICATIONS AND CHARACTERIZATION
FOCALPLANE IMAGE PROCESSING
3 other sections not shown
1/f noise achieved analog applications array averaging backside Blouke bump bonding buried channel buried-channel camera capacitance CCD Image Sensor charge packet charge transfer efficiency charge-coupled device chip clock dark current detector display drain dynamic range effect electrons epitaxial F F F fabricated film floating diffusion floating gate focal plane Ford Ford Aerospace frequency IEEE illumination image sensor increases input integration Janesick layout linear measured microns MOSFET node capacitance noise floor operation optical output amplifier output circuit output node performance phase photodiode photon photosite pixel Proc Quadrant-CCD quantum efficiency read noise readout noise reduced resolution response sampling scan sensitivity shift register shot noise shown in Figure shows signal charge signal level silicon Skipper CCD source follower SPIE structure substrate surface tantalum TDI imager Technology Tektronix temperature transfer gate transistor trap voltage wafer X-ray