Handbook of X-Ray Spectrometry"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum." |
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Contents
IV | 1 |
V | 2 |
VI | 3 |
VII | 7 |
VIII | 17 |
IX | 31 |
X | 34 |
XI | 36 |
LXXI | 497 |
| 498 | |
LXXIII | 501 |
LXXIV | 503 |
LXXV | 506 |
LXXVI | 507 |
LXXVII | 523 |
LXXVIII | 524 |
XII | 40 |
XIII | 49 |
XIV | 53 |
XV | 56 |
XVI | 58 |
XVII | 68 |
XVIII | 74 |
XIX | 76 |
XX | 78 |
XXI | 87 |
XXII | 91 |
XXIII | 92 |
XXIV | 95 |
XXV | 100 |
XXVI | 104 |
XXVII | 150 |
XXVIII | 169 |
XXIX | 173 |
XXX | 189 |
XXXI | 191 |
XXXII | 199 |
XXXIII | 200 |
XXXIV | 214 |
XXXV | 230 |
XXXVI | 236 |
XXXVIII | 239 |
XXXIX | 240 |
XL | 245 |
XLI | 260 |
XLII | 264 |
XLIII | 268 |
XLIV | 278 |
XLV | 300 |
XLVI | 306 |
XLVII | 315 |
XLVIII | 336 |
XLIX | 341 |
L | 343 |
LI | 350 |
LII | 359 |
LIII | 362 |
LIV | 402 |
LV | 403 |
LVI | 407 |
LIX | 408 |
LX | 415 |
LXI | 423 |
LXII | 430 |
LXIII | 433 |
LXIV | 435 |
LXV | 442 |
LXVI | 456 |
LXVII | 469 |
LXVIII | 474 |
LXIX | 495 |
LXX | 496 |
LXXIX | 525 |
LXXX | 530 |
LXXXI | 532 |
LXXXII | 542 |
LXXXIII | 545 |
LXXXIV | 551 |
LXXXV | 555 |
LXXXVI | 559 |
LXXXVII | 560 |
LXXXVIII | 567 |
LXXXIX | 574 |
XC | 583 |
XCI | 588 |
XCII | 590 |
XCIII | 595 |
XCIV | 597 |
XCV | 599 |
XCVI | 603 |
XCVII | 605 |
XCVIII | 610 |
XCIX | 618 |
C | 627 |
CII | 628 |
CIII | 629 |
CIV | 631 |
CV | 637 |
CVI | 646 |
CVII | 667 |
CVIII | 696 |
CIX | 712 |
CX | 719 |
CXI | 720 |
CXII | 727 |
CXIII | 739 |
CXIV | 748 |
CXV | 750 |
CXVI | 783 |
CXVII | 792 |
CXVIII | 797 |
CXIX | 811 |
CXX | 816 |
CXXI | 857 |
CXXII | 876 |
CXXIII | 909 |
| 926 | |
CXXV | 933 |
CXXVI | 934 |
CXXVII | 944 |
CXXVIII | 948 |
CXXIX | 958 |
CXXX | 965 |
CXXXI | 968 |
CXXXII | 970 |
| 977 | |
Other editions - View all
Handbook of X-Ray Spectrometry, Second Edition, Rene Van Grieken,A. Markowicz No preview available - 2002 |
Common terms and phrases
absorption addition Anal analysis analytical angle applications atomic background beam calculated channel characteristic coefficients collected combination compared composition concentration CONTINUE continuum correction count crystal curve dependent described detection limits detector determined developed direct distribution effect efficiency electron elements emission energy equation error et al example excitation experimental expression factor Figure filter fitting fluorescence function geometry given important incident increase intensity layer lead less lines maps mass material matrix measured metals method normal obtained parameters particle peak performed photon PIXE polarization position possible present primary procedure quantitative radiation range ratio reduced reflection region relative resolution sample scattering sensitivity shown shows specimen spectra spectrometer spectrum standard surface Table techniques thickness thin trace typical values various window x-ray x-ray tube
Bibliographic information
| Title | Handbook of X-Ray Spectrometry Practical Spectroscopy |
| Editors | Rene Van Grieken, A. Markowicz |
| Edition | 2, revised |
| Publisher | CRC Press, 2001 |
| ISBN | 0203908708, 9780203908709 |
| Length | 1016 pages |
| Subjects | › › Science / Chemistry / General Science / Chemistry / Industrial & Technical |
| Export Citation | BiBTeX EndNote RefMan |