Current Developments in Optical Engineering II: 18-21 August 1987, San Diego, California |
Contents
SCATTERING AND COATINGS | 53 |
LASERS AND MATERIALS | 93 |
OPTICAL STORAGE AND LENS DESIGN | 188 |
Copyright | |
10 other sections not shown
Common terms and phrases
algorithm alignment angle of incidence aperture array astigmatism axis beam dumps BRDF calculated camera coefficients color configuration corner reflector crystal curve density depolarization factor detector diameter diffraction diode display edge effect electrons ellipsometry equation error exit pupil field field-of-view film filter flat focal length Gaussian Gaussian beam instrument signature integrator intensity interferogram interferometer irradiance Jones matrix laser lens light linear matrix measurements MEGAPLUS merit function meter method microns mirror mode obtained optical system optimization output paper parameters pattern phase pixels plane plot polarization aberrations prism profilometer radius ratio reflected refractive refractive index region Ritchey-Chretien rms roughness rotating sample scan scatter sensor shift shown in Figure shows signal spatial frequency spectral spherical spherical aberration SPIE stylus technique telescope temperature thickness three-mirror tilt vector aberrations wave wavefront wavelength Zernike