Interfacial Engineering for Optimized Properties: Symposium Held December 2-5, 1996, Boston, Massachusetts, U.S.A., Volume 1
C. L. Briant, C. Barry Carter, Ernest L. Hall
Materials Research Society, 1997 - Technology & Engineering - 510 pages
The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. Researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This book goes a step further to explore how all of this information can be used. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The EBSP in solving a number of interface-related problems is also featured. Topics include: introductory concepts and modelling; characterization - orientation and interfacial films; characterization - microscopy and chemistry; mechanical properties; general interfaces; composites, laminates and coatings and thin films.
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Acta Metall adhesion alloys alumina amorphous analysis angle annealed atoms behavior bicrystal bond strength bulk c-BN calculated carbon Ceram chemical coating composition concentration corrosion crack creep crystal curve debonding decrease deformation delamination deposition diamond diffraction diffusion dislocations doped ductility effect elastic elastic modulus electron microscopy ELNES embrittlement experimental fiber Figure fracture energy fracture toughness grain boundary heat treatment impurity increase indentation interface intergranular laminate lattice layer load magnetic matrix measured micrograph microstructure misorientation modulus multilayers Ni3Al NiAl observed obtained orientation oxide parameters periclase phase Phys plane plasma spray polycrystalline polymer powders reaction region residual stress resistance room temperature rotation samples segregation shear shown in Fig shows silicon nitride simulations sintered slip specimens spectra sputtering strain structure substrate surface technique tensile thickness thin films transmission electron microscopy undoped values whisker X-ray YBCO