Stockholm Conferences, 9 to 12 June 1959: X-ray Wavelength Problems; Precision Lattice Parameter Determination; Counter Methods for Crystal Structure AnalysisKarolinska Institute, Department of Medical Physics and Physiology, 1959 - X-ray crystallography - 94 pages |
Common terms and phrases
absorption accuracy accurate Acta Cryst advantage analysis angle angular apparatus Application arranged Atomic automatic background calculated camera Chairman circles collection Conference considerably counting CRYSTAL STRUCTURE Crystallography curves described designed detector diffractometer direct discussed distribution effect electronic eliminated Energy error estimated experimental factors Fehler function Furnas given gives goniometer Institute Instr intensity measurements internal Laboratory lattice constant LATTICE PARAMETER DETERMINATION lattice parameter measurements limits machine MEASUREMENTS OF LATTICE ments methods monochromator mounted nature neutron observations obtained oper Parrish peak Pepinsky Physics planes position possible powder PRECISION LATTICE PARAMETER present PROBLEMS Prof Project protein punched radiation raies recording reflection refraction correction relative reported sample scale scintillation counter Session settings single crystals specimen Stockholm tape techniques temperature thermal tion University values various Verteilung wavelength Wilson X-RAY DIFFRACTION York