The Infrared and Electro-optical Systems Handbook, Volume 5J. S. Accetta, David L. Shumaker This eight-volume set is an authoritative collection presenting state-of-the-art information on infrared and electro-optical systems. The handbook has been completely revised and updated, featuring 45 chapters written by 80 experts in IR/EO technology. |
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Page 232
... limited . Photoconductors that are generation - recombination noise limited will have a lower DILIP by a factor of V2 . All of the photon - noise - limited expressions given here are only for Poisson statistics , when the Bose ...
... limited . Photoconductors that are generation - recombination noise limited will have a lower DILIP by a factor of V2 . All of the photon - noise - limited expressions given here are only for Poisson statistics , when the Bose ...
Page 258
... limited diodes at 5 μm and diffusion - limited diodes at the longer wavelengths . The data set in Fig . 4.43 comprises p - on - n polarity devices . 101 MWIR data for n - on - p devices is comparable to p - on - n , while for LWIR ...
... limited diodes at 5 μm and diffusion - limited diodes at the longer wavelengths . The data set in Fig . 4.43 comprises p - on - n polarity devices . 101 MWIR data for n - on - p devices is comparable to p - on - n , while for LWIR ...
Page 647
... limited beam has an elliptical cross section with a beam divergence angle of approximately 20 to 30 deg in the plane orthogonal to the junction and ~ 5 deg in the plane parallel to the junc- tion . Optical systems are available that ...
... limited beam has an elliptical cross section with a beam divergence angle of approximately 20 to 30 deg in the plane orthogonal to the junction and ~ 5 deg in the plane parallel to the junc- tion . Optical systems are available that ...
Common terms and phrases
1/f noise aberration amplifier angle aperture applications arrays axial bandwidth beam bias bolometer capacitance capacitor charge circuit coefficient configurations constant cooler cooling cryocooler cryogenic curve cylinder density detector devices diode display dynamic electrical electron energy equations filter flux focal plane frequency gain heat HgCdTe incident infrared input integration irradiance Irtran laser lens limited linear liquid crystal load material maximum measured mirror modulation MOSFET multiplexer node operation Optical Society optical system oscillation output p-n junction parameters performance photoconductors photon pixel preamplifier quantum efficiency radiation ratio readout referred noise refractive index refrigerator reset resistor responsive element reticle sample scan semiconductor sensor shown in Fig signal silicon slew rate specific spectral response stress surface Table temperature thermal conductivity thermal noise transfer function transimpedance amplifier transistor unit cell voltage wavelength