Microwave Electronics: Measurement and Materials CharacterizationThe development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference. |
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Results 1-3 of 84
Page 159
... shown in Figure 3.25 is a special case of the configuration shown in Figure 3.3 with Al 0. This configuration was first used by von Hippel et al . to measure the dielectric properties of materials ( Von Hippel 1995 ) . The input ...
... shown in Figure 3.25 is a special case of the configuration shown in Figure 3.3 with Al 0. This configuration was first used by von Hippel et al . to measure the dielectric properties of materials ( Von Hippel 1995 ) . The input ...
Page 262
... shown in Figure 6.5 , we use the two retuning plungers ( labeled 3 and 4 ) to retune the resonant frequency of the sample - loaded cavity back to the frequency before the sample is introduced . In the retuning procedure , the two ...
... shown in Figure 6.5 , we use the two retuning plungers ( labeled 3 and 4 ) to retune the resonant frequency of the sample - loaded cavity back to the frequency before the sample is introduced . In the retuning procedure , the two ...
Page 463
... shown in Figure 11.6 . These values provide control of the quality of the contacts . Fur- thermore , they are used ... Figure 11.5 , which C1 C2 2 1 HE VI 50 Ω C3 + C4 w V2 Figure 11.6 Equivalent circuit for the measurement of the ...
... shown in Figure 11.6 . These values provide control of the quality of the contacts . Fur- thermore , they are used ... Figure 11.5 , which C1 C2 2 1 HE VI 50 Ω C3 + C4 w V2 Figure 11.6 Equivalent circuit for the measurement of the ...
Contents
Microwave Theory and Techniques for Materials Characterization | 37 |
1 | 142 |
TransmissionReflection Methods | 175 |
Copyright | |
16 other sections not shown
Common terms and phrases
air gap antenna applied Baker-Jarvis calculated calibration capacitance capacitor characteristic impedance chiral circular waveguide coaxial line coaxial probe complex permittivity components conductor configuration coupling dc magnetic field determined dielec dielectric constant dielectric materials dielectric permittivity dielectric properties dielectric resonator dielectric rod dielectric sample dielectric waveguide discussed electric field electromagnetic properties equations ferrite ferromagnetic resonance field distribution free space free-space H₂ Hall effect IEEE Transactions layer loop loss tangent low-loss magnetic field magnetic materials microstrip microstrip line microwave frequencies microwave microscope Microwave Theory obtained parameters permeability tensor permittivity and permeability perturbation phase planar polarization propagation quality factor rectangular waveguide reflection coefficient reflection method resonant frequency resonant modes resonator method rotation S-parameters sample under test shown in Figure stripline structure substrate superconducting surement surface impedance surface resistance temperature Theory and Techniques thickness tion Transactions on Microwave transmission line tric Varadan voltage wave wavelength