Electron Microscopy 1998: Proceedings of the 14th International Congress on Electron Microscopy, Cancun, Mexico, August 31-September 4 1998
The 14th International Congress on Electron Microscopy, held in Cancun, Mexico, provides a forum for all scientists working in physics, materials science and biological sciences research to discuss and share their results and ideas.
This four-volume set documents recent advances in microscope technology and applications in scientific research, from HREM studies of quasicrystal and nanoscale materials to biomembrane research and art history.
The 1998 meeting features a large number of contributions from Latin American countries, and a special symposium (IFSEM) on scanning electron microscopy.
This is a comprehensive guide to the uses of microscopy in the pursuit of science for all researchers in physics, materials science and biological sciences.
What people are saying - Write a review
We haven't found any reviews in the usual places.
Other editions - View all
Electron Microscopy 1998: Proceedings of the 14th International Congress on ...
Ron A. Hector
No preview available - 1998
31 August accelerating voltage analysis analytical applied atomic calculated Cancun carbon cathode cathodoluminescence CCD camera cell chemical contrast correction crystal defocus detection detector developed diffraction pattern distribution EFTEM electron beam electron crystallography electron diffraction electron holography energy filter energy loss experimental field emission Figure film Fourier function high resolution Hitachi HRTEM ICEMI4 intensity interface irradiation Japan JEOL Laboratory lattice layer linear motor magnetic magnification measured method Mexico microanalysis micrographs modulation objective lens observed obtained optical Paper presented parameters particles peak phase Phys pixel plane plasmon potential presented at ICEM14 probe Proc quantitative reconstruction References sample scanning electron scanning electron microscope scattering scintillator secondary electron September 1998 Symposium shown in Fig shows signal silicon simulated specimen spectra spectrum spherical aberration structure surface technique thickness thin tilt transmission electron microscopy Ultramicroscopy University voltage Volume wave X-ray