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amplifier aperture arcsec astronomical background bandwidth beam brightness calibration camera tube cascade cathode contrast coupled curve deflection density detection detector device diagram diameter diode effect electron electronographic element emission emulsion exposure face-plate fiber-optic fibre-optic field Figure film filter focus focused frames gain Ilford illumination image tube input integration isocon lens light limit linear low light-levels lp/mm magnetic magnitude measured modulation modulation transfer function noise Observatory observed obtained operation optical output parameters pattern performance phosphor phosphor screen photocathode photoelectrons photographic photometric photomultiplier photon Plumbicon psec pulse quantum efficiency read-out recorded resolution Royal Greenwich Observatory scan scintillation SEC target SEC vidicon sensitivity shown in Fig shows signal signal-to-noise ratio slit spatial frequency Spectracon spectral spectrograph spectrum storage technique telescope variations vidicon voltage wavelength width X-ray image intensifier
Page xi - Department of Pure and Applied Physics The Queen's University of Belfast Belfast BT7 INN, Northern Ireland ABSTRACT An ultrafast streak camera for vacuum UV to X-ray radiation is described.
Page x - Department of Electrical Engineering, University of Rhode Island, Kingston, RI 02881, USA (p. 389) J. LEQUAIS, Centre d'Etudes Nucleaires de Saclay, Service d'Electronique Physique, Gif-sur-Yvette, France (p. 1017) JAJ v. LBUNBN, NV Philips' Gloeilampenfabrieken, Eindhoven, The Netherlands (p.
Page xii - Lick Observatory Board of Studies in Astronomy and Astrophysics University of California Santa Cruz...
Page 602 - on" time of an electronic switch, during which the signal and noise voltage is fed directly into an integrator. 3y ic^ipling successive intervals and averaging, it is possible to reduce the noisevoltage fluctuation observed at the integrator output without affecting the signal level. Quantitatively, the noise -voltage fluctuations are reduced by where N is the number of observations made during the measurement.