Electron Microscopy, Volume 2 |
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Contents
HIGH VOLTAGE ELECTRON MICROSCOPY | xviii |
Instrumentation | 891 |
Present and future of ultra high voltage electron microscope in Osaka University | 897 |
Copyright | |
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alloy amorphous analysis angle annealing atoms axis bubbles Burgers vector carbon cell clusters composition contrast crystalline crystallites D.J. Smith damage dark field defocus deformation density diameter diffuse domain electron beam electron diffraction electron diffraction pattern electron irradiation energy epitaxial field image Fig.l Figure foil formation formed fracture fringes grain boundaries growth heating high resolution electron high voltage electron HREM implantation in-situ increase interface interstitial investigated irradiation Japan lattice image layer magnetic martensite matrix mechanism metal micrograph microstructure modulation monoclinic nucleation observed obtained orientation oxide particles perovskite phase Phys plane point defects precipitates quasicrystal region room temperature samples shown in Fig shows silicon single crystal solution specimen spots stacking faults structure substrate superlattice surface technique tetragonal thickness thin films tilt tion transformation transmission electron transmission electron microscopy twin University vacancies vector voltage electron microscopy X-ray zeolite zone