Measurement technology and intelligent instruments VI
Trans Tech Publications Ltd., 2005 - Technology & Engineering - 768 pages
The topics covered include measurements for advanced materials, micro and nano measurement, biomedical and environmental measurement, optical precision measurement, form error, displacement and angle measurement, on-line and in-process measurement, micro and nano surface metrology, flow and thermal measurement, sensing systems, mechanical and physical quantity measurement, data, signal and image processing for precision measurement: covering novel designs and techniques in sensor and sensing systems and investigations of the characteristics and performances of precision sensor and sensing systems. The book presents the newest information, for application by active researchers and engineers, and forms the basis for further research in this field which is aimed at creating new and practical instrument systems and processes possessing enhanced functionality, precision and performance; all at reduced cost.
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Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped
Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica
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2005 Trans Tech algorithm amplitude amplitude modulation analysis angle angular application atomic force microscope autocollimator axis beam calculated calibration CCD camera China Keywords circuit coil coordinate system curve deformation detection detector developed device direction displacement dynamic edge detection Engineering evanescent wave Experimental Results fiber film force function Gaussian filtering grating heterodyne input interferometer interpolation Kalman filter laser lens linear linear motor machine magnetic field measurement error measurement results measurement system measuring range mechanical method mode modulation nanoparticles natural frequency o-light object obtained online at http://www.scientific.net optical optical fiber osseointegration output parameters pattern phase pixels plane polarized position precision pressure principle probe profilometer reference reflected resolution rotation sampling scanning Schematic sensor shown in Fig shows signal stage structure super-resolution surface Switzerland technique Technology temperature Trans Tech Publications transducer vibration voltage wave wavelength