Proceedings, ... Annual Meeting, Electron Microscopy Society of America, Volume 50, Part 2San Francisco Press, 1992 - Electron microscopes |
Contents
PARTI see other volume | 896 |
New instrumentation 936 | 918 |
Scanning electron microscopy 1276 | 924 |
Copyright | |
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27th Annual Meeting alloy analyzed annealed atomic number backscattered biological calculated Canada Copyright Canada/Société de Microscopie carbon cell composition concentration contrast crystal density deposited detection detector determined dislocations du Canada Copyright electron beam electron diffraction electron microscopy elements emission EMSA energy loss filter fluorescence function grain boundaries Held jointly implant intensity interface layer matrix measurements metal method microanalysis Microbeam Analysis Society micrograph microprobe Microsc Microscopical Society Microscopie du Canada microstructure morphology observed obtained optical oxide oxygen parameters particles peak phase Phys pixel probe Proc Published by San quantitative Raman ratio region Research sample San Francisco Press scanning electron microscopy scattering shown in Figure shows silicon Society of Canada/Société spatial resolution specimen spectra spectrometer spectroscopy spectrum structure substrate surface techniques temperature thickness thin film transmission electron microscopy Ultramicroscopy voltage x-ray