Practical Materials CharacterizationMauro Sardela Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences. |
Contents
1 | |
Introduction to Optical Characterization of Materials | 43 |
XRay Photoelectron Spectroscopy XPS and Auger Electron Spectroscopy AES | 93 |
Secondary Ion Mass Spectrometry | 133 |
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Common terms and phrases
absorption alignment angle of incidence angular applications Auger electron spectroscopy beam tilt Binding energy Cameca IMS chemical collected configuration corresponding density depth profiling detection limits detector determined diffraction peaks direction EFTEM elements ellipsometry emission Epitaxial example focus fringes function grown and analyzed Haasch RT HREM image implant instrument intensity interface ion yields lattice constant layer lens light magnetic sector mass resolution mass spectrometry material measured metal method microscope mode obtain optical constants oxygen parameters phase photons Phys plane polarization positive secondary ions powder primary beam primary ion probe Raman range ratio reciprocal lattice reciprocal space relative rotating sample surface scan scattering sector instrument shown in Fig shows signal SIMS specimen spectra spectrometer spectrophotometry spectroscopy specular reflectance sputtering structure substrate Surf Sci surface normal technique thickness thin films tilt transmission transmission electron microscopy typically voltage wavelength