Ellipsometer Studies of Silver Single Crystals |
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18 HOURS absorption coefficient absorption curve analyzer readings angle of incidence ANGSTROMS annealing and argon annealing at 600°C ANNEALING FOR 18 approximately bakeout Brillouin zone Comparison Computed Oxidation copper critical wavelength cross-hair dielectric constant dispersion curves divided circles effect electric vector vibrating electron electropolished electropolished surface equations Evaporated Film Fermi surface Film of Silver film thickness increased filter further argon bombardment high temperature vacuum HOURS AT 600°C INITIAL ARGON BOMBARDMENT LIBRARY CORNELL light beam limiting film measurements mechanically polished surface metal minutes monochrometer observed obtained optical properties Oxidation of 111 oxide film thickness oxide growth perpendicular phase change photoelectric interband absorption photomultiplier plane of incidence polarizer and analyzer reactor refractive index shown in Figure Silver Crystal silver oxide silvered optical flat single crystals spectrometer axis steady-state film thickness steady-state oxide film surface optical constants telescope and collimator temperature vacuum annealing thermal etching Visible Region wavelength region