Scanning Electron Microscopy, Parties 1 à 3Om Johari, Robert P. Becker Scanning Electron Microscopy, Incorporated, 1978 Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops. |
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Table des matières
THE ELECTRON ENERGY LOSS SPECTRUM | 25 |
POST SPECIMEN OPTICS FOR ENERGY LOSS SPECTROMETRY | 33 |
INSTRUMENTATION AND SOFTWARE FOR ENERGYLOSS MICROANALYSIS | 41 |
Droits d'auteur | |
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Expressions et termes fréquents
aberration AMF O'Hare analysis angle aperture atoms Authors beam current biological specimens brightness carbon cathode Cathodoluminescence cells chrysotile contamination contrast crystal crystallites CTEM density deposition detection detector determination diameter diffraction pattern Echlin edge effect electron beam electron gun emission emitter energy loss evaporation ferritin fibers field Figure filament film thickness filter glutaraldehyde gold films grain high resolution intensity LaB6 layer lens limited magnification mass thickness material measurements metal coating metal films method micro micrographs molecules monitor object objective lens observed obtained operation optical palygorskite parameters particles penning sputtering photon Phys plane platinum platinum films post specimen quantitative quartz radiation sample scanning electron microscopy scattering shadow signal spectrometer spectrum spherical aberration structure substrate surface technique temperature thin films tion tissue transmission electron transmission electron microscopy tungsten vacuum vermiculite voltage X-ray