First European Conference on Optics Applied to Metrology, October 26-28, 1977, Strasbourg (France) |
Common terms and phrases
amplitude analysis angle application axis calculated components considered contour corresponding deformation depends described detection determined developed device difference diffraction diffusing direction displacement distance distribution double effect equation examined example experimental experiments exposure field figure filtering frequency fringes function given gives grating grid hologram holographic interferometry illuminated incidence intensity interference interferogram Introduction laser layer length lens light limited lines load material means measurement mechanical method modulation moiré object observation obtained optical parallel path pattern permits phase photographic placed plane plate polarization position possible precision present problem produced pulse reconstruction recording reference beam reflected relative represents rotation sample sensitivity shift shown shows signal space spatial speckle spectrum strain stress surface technique thickness tion translation values variations vector vibration wave wavelength